 |
|
|
|
2005 NSF Research Experience for Teachers (RET) Program |
|
The field-emission gun Scanning electron microscope (FEG-SEM) has a resolution of 1.5 nm and a magnification range of 10x to 400,000x. This microscope can also create secondary and backscattered images and X-ray mapping, which allows the user to determine the chemical make-up of the sample. To see some of these images, click the link to the left. |
The transmission electron microscope (TEM) requires very thin samples (<500nm) so that the electron beam can pass through the sample to the object below. This microscope can magnify images up to 700,000 times. To see these images, click the link to the left. |
|
|
|
|
|
