Murti Salapaka

Professor

Research Area: Systems and Control

	5-161 Keller Hall
	612-625-7811
	murtis@umn.edu
	http://www.ece.umn.edu/~murtis/

Area of Expertise:

Control and dynamic systems and application to nano- and bio-interrogation

Education:

Ph.D., EE, 1997, University of California, Santa Barbara, CA, United States
M.S., EE, 1993, University of California, Santa Barbara, CA, United States
B.Tech., ME, 1991, Indian Institute of Technology, Madras, India

Honors/Awards:

Vincentine Hermes-Luh Chair in Electrical and Computer Engineering

Dean’s Fellowship for outstanding graduate performance, University of California, Santa Barbara, 1992

CAREER Award, 1998, National Science Foundation

ISU, Young Engineering Faculty Research Award, 2001

Litton Chair, Electrical and Computer Engineering Department, 2002

Students Tathagatha De and Abu Sebastian’s paper highlighted in Photonics magazine, 2005

Thermally Driven Non-contact Atomic Force Microscopy highlighted in Nature, September 22, 2005

Student, Deepak Sahoo’s paper, selected one of the top 5 papers at the American Control Conference, 2007

Keynote Lecture “Control and Systems Approaches to Atomic Force Microscopy”, International Federation of Automatic Control (IFAC), 17th IFAC World Congress, July 6-11, 2008, Seoul, Korea

Synopsis:

Prof. Salapaka research spans control theory and its applications to nano-interrogation and bio-manipulation at the molecular scale using laser tweezers and atomic force microscopes.

Publications:

Tathagata De, Pranav Agarwal, Deepak R. Sahoo, and Murti V. Salapaka. “Real-time detection of probe loss in atomic force microscopy”. Applied Physics Letters, 89 (2006): 133119.

Anil Gannepalli, Abu Sebastian, Jason Cleveland, and M. V. Salapaka. “Thermally driven non-contact atomic force microscopy”. Applied Physics Letters, 87.11 (2005): 111901.

Xin Qi(s), M. V. Salapaka, Petros G. Voulgaris, and Mustafa Khammash. “Structured optimal and robust control with multiple criteria: A convex solution”. IEEE Transactions on Automatic Control, 49.10 (October 2004): 1623-1640.